Modeling Multilayered Sample of Inorganic and Organic Speckle Structures

We present the numerical models, analysis, and evaluation of a multilayered periodic structure applicable within nanoelectronics. The models can be advantageously employed in the characterization of electromagnetic arameters, thus helping researchers and designers to solve problems associated with nanoelectronics, nanophotonics, resonance-based sensors, and related components. The given models of a large periodic structure are designed to evaluate the parameters of electromagnetic wave propagation within speckle elements. Utilizing the interpreted results, a functional sample structure can be experimentally fabricated after basic nano-design changes. In the described context, the outcomes of a numerical analysis of the investigated simple nanoelectric multilayer structure are also introduced.